PHOENIX CONTACT膜厚仪Surfix BN

PHOENIX CONTACT膜厚仪Surfix BN

Surfix BN非铁基膜厚仪特点：

德国PHYNIX公司制造

基本型,碳化钨超耐磨测头.特快反应速度

可测有色金属涂镀层

基体上涂层,量程1500μm

精度±1μm+1%读数.分辨率0.1μm,读数背景光

有红外可接PC及打印机

Surfix BN非铁基膜厚仪Surfix BN膜厚仪，铝基膜厚仪技术参数：

测量范围 0-1500?m,0 - 60mils

误差±（1?m+1%读数）

分辨率0.1?m或小于读数的2%

显示背光，字母加数字， 10mm高，4位数字显示

基体 小面积5mmX5mm

基体 小曲率凸面：1.5mm 凹面：5mm

基体 小厚度 F型：0.2mm ,N型： 50?m

校准厂家校准，零校准，校准箔校准

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